Veeco

Metrology and Instrumentation

Atomic Force Microscopes ( AFM )

Automated AFM / AFP

Optical Interferometric Profilers

Confocal Microscopes

Stylus Profilers

Nanotheater

Veeco Probes

Epitaxial Equipment

MBE Components

MBE Sources

MBE Systems

MOCVD Systems

Process Equipment

NEXUS Diamond like carbon Depopsition System

NEXUS Ion beam Deposition System

NEXUS Ion beam Etch Systems

Ion Sources

NEXUS Physical Vapour Deposition Systems

Thermal Deposition Systems

CIGS Coating Systems